发明名称 |
TEST SYSTEM AND METHODOLOGY |
摘要 |
A test system for testing an electronic device is deployable in two basic configurations. In one of the configurations, a load board (62) that receives a unit (60) of the device is directly attached to a test head (16). In the other configuration, the same load board or one having largely the same pattern of test-head signal transmission positions is coupled through an interface apparatus (66) to a test head. A probe system (64) contacts that load board or/and the interface apparatus. The interface apparatus is normally configured to largely prevent test-head vibrations from being transferred to the probe system. Additionally, or alternatively, the load board is vacuum attached to the interface apparatus. |
申请公布号 |
WO2004008487(A3) |
申请公布日期 |
2004.06.03 |
申请号 |
WO2003US19220 |
申请日期 |
2003.06.17 |
申请人 |
NPTEST, LLC |
发明人 |
SAUK, FRANK, M.;WELLS, GARY, A.;HO, THOMAS, P. |
分类号 |
G01R31/26;G01R31/28;G01R31/302;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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