发明名称 SEMICONDUCTOR WAFER HAVING IDENTIFICATION TAG, MASK, WAFER CARRIER, MASK CARRIER, ALIGNER USING THEM, AND SEMICONDUCTOR INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer having few limitations in an adhesion part, an identifying means for a mask of an aligner, and the aligner and a semiconductor inspection device capable of identifying them. <P>SOLUTION: This wafer 1 and the mask 6 are provided with wireless non-contact identification tags 5 and 11, while the aligner 20 and the like is provided with the wireless non-contact identification tag reading means 33 and 34, storage means 21 and 22 for storing identification information stored in the tag and attributes such as a control parameter of the wafer and the like to which the tag is stuck while associating the identification information with the attributes, and collation means 23 and 24 collating the read identification information of the tag read by the reading means to the stored identification information. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004157765(A) 申请公布日期 2004.06.03
申请号 JP20020322852 申请日期 2002.11.06
申请人 TOKYO SEIMITSU CO LTD 发明人 KAWAMURA YUKISATO
分类号 G03F7/20;G06K17/00;G06K19/00;G06K19/07;H01L21/027;H01L21/66;H01L21/673;H01L21/68 主分类号 G03F7/20
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