| 摘要 |
PROBLEM TO BE SOLVED: To provide a high-frequency measuring method and a vector network analyzer utilizing a TRL calibration method capable of reducing an influence of inconsistencies of, for example, a conversion part between a microstrip line and a coaxial line in a TRL standard or a DUT mounting substrate. SOLUTION: A reflection coefficient near a connection part between a TOSL calibration reference plane of this vector network analyzer and the TRL standard or the DUT mounting substrate is adjusted to a prescribed value by utilizing time domain measuring function of the vector network analyzer, and an S parameter of the DUT mounting substrate is corrected by using an S parameter of the TRL standard measured in the state, to thereby calculate an S parameter of the DUT. The reflection coefficient near the connection part between the TOSL calibration reference plane of the vector network analyzer and the TRL standard or the DUT mounting substrate becomes approximately constant and hereby an error cause of the TRL calibration method is reduced by this method, to thereby improve high-frequency measurement accuracy. COPYRIGHT: (C)2004,JPO
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