| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of a test with an irregular test pattern by adding a simple constitution to a semiconductor testing device for testing with a regular test pattern. SOLUTION: A driver board 16 outputs an algorithmic pattern 41 constituted of the regular test pattern corresponding to a semiconductor device to be tested. A control circuit 23 of a relay board 17 inputs the algorithmic pattern 41 from the driver board 16, and determines whether the algorithmic pattern 41 is coincident with a prescribed pattern set beforehand. When determined to be coincident, the control circuit 23 transmits a random pattern 40 read out from a vector memory 22 toward the semiconductor device (logic product) to be tested. COPYRIGHT: (C)2004,JPO
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