发明名称 HIGH HEAT RADIATION SILICON WAFER AND SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To improve the heat radiating performance from the back face of a silicon chip, to improve heat radiating performance from a semiconductor device including a silicon chip, and to stably cool a semiconductor device, and to perform a stable operation. <P>SOLUTION: High radiation painting constituted of a binder solid content 100 pts. mass and heat absorption pigment 10 to 150 pts. mass is painted on the back face of a silicon wafer, and a metal plate treated with high heat radiation painting is adhered to the back face of the silicon wafer. It is desired that an integrated circuit is formed on the silicon wafer, and then the high heat radiation painting or high heat radiation painting metal plate adhering is preferable in a process prior to dicing. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004158707(A) 申请公布日期 2004.06.03
申请号 JP20020324163 申请日期 2002.11.07
申请人 NIPPON STEEL CORP 发明人 UEDA KOHEI;TANAKA MASAMOTO;KANAI HIROSHI
分类号 H01L23/34;H01L23/40;(IPC1-7):H01L23/34 主分类号 H01L23/34
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