| 摘要 |
PROBLEM TO BE SOLVED: To enable a test of an IC device by sharing a socket board. SOLUTION: Lands of patterns corresponding to a connecting terminal arrangement of the IC device are respectively formed on both faces of the socket board for the test. That is, in the socket board for the test, because the lands of the patterns corresponding to the connecting terminal arrangement of the IC device which has an even number of terminal arrangement are formed on one face, and because the lands of the patterns corresponding to the connecting terminal arrangement of the IC device which is an odd number of terminal arrangement is formed on another face, it becomes possible to inspect the IC devices of the even number terminal arrangement or the odd number terminal arrangement by exchanging the front and the rear of the socket board for the test. Thus, it becomes possible to test different kinds of IC devices by sharing one socket board for the test. COPYRIGHT: (C)2004,JPO
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