发明名称 |
METHOD FOR FORMING DRAM CELL HAVING STORAGE NODE |
摘要 |
PURPOSE: A method for forming a DRAM(Dynamic Random Access Memory) cell having a storage node is provided to be capable of increasing the margin degree for a cleaning process before a storage node layer depositing process without forming a bridge between neighboring storage nodes. CONSTITUTION: An interlayer dielectric and a protecting layer(19) are sequentially formed on a semiconductor substrate(1). A plurality of storage node plugs(21) are formed through the protecting layer and the interlayer dielectric. A molding layer(23) having an etch selectivity ratio for the protecting layer is formed on the resultant structure. A plurality of pre-storage node holes are formed by selectively patterning the molding layer for exposing each storage node plug. Then, enlarged storage node holes are formed by carrying out a cleaning process on the exposed storage node plugs. A plurality of storage nodes(27) are formed in the enlarged storage node holes for contacting the cleaned storage node plugs. Preferably, the protecting layer and the molding layer are made of a silicon nitride layer and a silicon oxide layer, respectively.
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申请公布号 |
KR20040045765(A) |
申请公布日期 |
2004.06.02 |
申请号 |
KR20020073619 |
申请日期 |
2002.11.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, SE MIN;YOO, SEOK WON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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主权项 |
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地址 |
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