发明名称 ELECTRICAL TEST PROBES AND METHODS OF MAKING THE SAME
摘要 A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
申请公布号 KR20040045452(A) 申请公布日期 2004.06.01
申请号 KR20047004246 申请日期 2002.09.24
申请人 发明人
分类号 G01R1/067;G01R3/00 主分类号 G01R1/067
代理机构 代理人
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