发明名称 Method of fabricating pressure sensor monolithically integrated
摘要 A method of making a monolithically integrated pressure sensor includes making a cavity in the semiconductor substrate. This may be formed by plasma etching the front side or the back side of the silicon wafer to cut a plurality of trenches or holes deep enough to extend for at least part of its thickness into a doped buried layer of opposite type of conductivity of the substrate and of the epitaxial layer grown over it. The method may also include electrochemically etching through such trenches, and the silicon of the buried layer with an electrolytic solution suitable for selectively etching the doped silicon of the opposite type of conductivity, thereby making the silicon of the buried layer porous. The method may also include oxidizing and leaching away the silicon so made porous.
申请公布号 US6743654(B2) 申请公布日期 2004.06.01
申请号 US20010014880 申请日期 2001.12.11
申请人 STMICROELECTRONICS S.R.L. 发明人 COFFA SALVATORE;OCCHIPINTI LUIGI
分类号 G01L9/00;(IPC1-7):H01L21/00 主分类号 G01L9/00
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