发明名称 |
METHOD AND APPARATUS FOR PROVIDING OPTIMIZED ACCESS TO CIRCUITS FOR DEBUG, PROGRAMMING, AND TEST |
摘要 |
An access interface (206) for accessing electrical nodes of an electronic circuit (208) for programming, testing, and debugging the electronic circuit (208). The access interface (206) includes a protocol generator and a data generator that may be programmed to apply control and/or data sequences directly to the electronic circuit. The access interface (206) performs operational commands based upon a plurality of states included in a programmable state machine. By suitably programming the protocol generator, the data generator, and the state machine, electrical nodes of th e electronic circuit can be accessed in reduced time using a reduced number of operations. The access interface (206) is controlled by a test resource apparatus (204), which communicates with the electronic circuit (208) connected to the access interface (206).</ SDOAB>
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申请公布号 |
CA2404059(C) |
申请公布日期 |
2004.06.01 |
申请号 |
CA20012404059 |
申请日期 |
2001.03.20 |
申请人 |
INTELLITECH CORPORATION |
发明人 |
DERVISOGLU, BULENT I.;CLARK, CHRISTOPHER J.;RICCHETTI, MICHAEL |
分类号 |
G01R31/317;G01R31/3185;(IPC1-7):G01R31/317;G01R31/318;H03K19/003 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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