发明名称 Method of making a semiconductor device by forming a masking layer with a tapered etch profile
摘要 A method for making a semiconductor device is described. That method includes forming a sacrificial layer on a substrate, then forming a layer of photoresist on the sacrificial layer. After the photoresist layer is patterned, to form a patterned photoresist layer that has a first opening, part of the sacrificial layer is removed to generate an etched sacrificial layer that has a second opening that is substantially smaller than the first opening.
申请公布号 US6743712(B2) 申请公布日期 2004.06.01
申请号 US20020195032 申请日期 2002.07.12
申请人 INTEL CORPORATION 发明人 PARK HYUN-MOG;LEU JIHPERNG;WU CHIH-I
分类号 H01L21/027;H01L21/033;H01L21/311;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/027
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