| 摘要 |
An electrical probe for a flying leadset of a logic analyzer probe has coaxially aligned internal elements enclosed in an insulating cover. The probe has an electrically conductive contact having contact fingers extending in one direction from a support member and a contact member extending in the opposite direction. A sleeve abuts the contact member and receive a center conductor of a conductive cable that is secured in the contact member. The insulating cover has a contact cover portion and a over-mold portion that are chemically bonded together. The contact fingers are positioned in the contact cover and the over-mold portion encapsulates the rest of the probe. The contact fingers are aligned parallel with one side of a square aperture formed in the contact cover. A resistive element may be interposed between the contact member and the sleeve.
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