发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE FOR TRAPPING IMPURITIES USING GETTERING LAYER
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to lengthen the lifetime of devices by trapping impurities using a gettering layer. CONSTITUTION: A gettering layer(20) is formed by implanting impurities into a semiconductor substrate(10). By annealing the gettering layer for 0.5-15 hours, the impurities in the substrate are trapped to the gettering layer. The gettering layer and the trapped impurities are removed by removing a desired thickness of the surface of the substrate.
申请公布号 KR100434960(B1) 申请公布日期 2004.05.28
申请号 KR19960043635 申请日期 1996.10.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, JAE GEUN
分类号 H01L21/322;(IPC1-7):H01L21/322 主分类号 H01L21/322
代理机构 代理人
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