发明名称 PROCEDURE FOR DENSITY MEASURING OF GRAIN MATERIAL LAYERS IN-SITU
摘要 The invention relates to a procedure for the on-site measurement of the compaction rate of granular material layers, especially for the determination of the compaction rate of material layers containing a solid part, liquid, and also material in the gaseous phase e.g. soils, during which, on the first part, a determined amount of deformation work is exerted on the surface of the material layer to be measured via the measuring instrument and the deformation of the material layer is measured, and, on the second part, the water content of the material layer is determined in a way that is known in itself, then from the deformation and the water content of the material layer the compaction rate of the material layer can be determined. <??>The characteristic feature of the invention is that, that equipment containing a measuring head and a falling weight that may be moved as compared to the measuring head is used as a measuring device and the material layer under examination is subjected to the deformation impact work during the on-site compaction with the consecutive impacts of the falling weight of the equipment, and during the on-site compaction the material layer under examination is subjected to deformation impact work equal to the amount of the deformation impact work exerted during the compaction carried out by a standard laboratory compactor machine that is known in itself.
申请公布号 HU0200715(A2) 申请公布日期 2004.05.28
申请号 HU20020000715 申请日期 2002.02.26
申请人 SUBERT ISTVAN 发明人 SUBERT ISTVAN
分类号 E02D1/02 主分类号 E02D1/02
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