发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF MANAGING SEMICONDUCTOR MANUFACTURING PROCESS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor device by which the sublimation of semiconductor-constituting atoms from the rear surface side of a semiconductor substrate can be prevented at the time of performing heat treatment, and to provide a method of managing a semiconductor manufacturing process. <P>SOLUTION: The method of manufacturing semiconductor device including a step for forming a gate insulating film on the semiconductor substrate 10, has a step for forming an insulating film 12 so as to cover the front and rear surface sides of the substrate 10, a step for etching off the insulating film 12 from the front surface side of the substrate 10, and a step for heat-treating the substrate 10 in a state where the insulating film 12 exists on the rear surface side of the substrate 10, are performed before the step for forming the gate insulating film. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004152920(A) 申请公布日期 2004.05.27
申请号 JP20020315188 申请日期 2002.10.30
申请人 FUJITSU LTD 发明人 FURUHASHI MASAYUKI;HORI MITSUAKI
分类号 H01L21/76;H01L21/30;H01L21/306;H01L21/308;H01L21/324;H01L21/8234;H01L27/08;H01L27/088;H01L29/78 主分类号 H01L21/76
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