发明名称 METHOD FOR FORMING INTERCONNECTION OF SUBSTRATE PENETRATION
摘要 PROBLEM TO BE SOLVED: To provide a method for forming the interconnection of substrate penetration for a microelectronic device including a substrate (30) having a surface and back side. SOLUTION: The method (10) is to form the interconnection of the substrate penetration for the microelectronic device including the substrate (30) having the surface and back side. This method includes a step for forming a circuit element (34) on the surface side of the substrate (30), a step for forming a trench (38) reaching the circuit element (34) on the back side of the substrate (30), a step for forming one layer (40) of a polymer insulating material in the trench (38), a step for removing a polymer material sufficient to expose at least a part of the circuit element (34), from the one layer (40) of the polymer insulating material, and a step for forming a conductive interconnection layer (42) electrically conducting to the circuit element (34) in the trench (38). COPYRIGHT: (C)2004,JPO
申请公布号 JP2004153269(A) 申请公布日期 2004.05.27
申请号 JP20030361648 申请日期 2003.10.22
申请人 HEWLETT-PACKARD DEVELOPMENT CO LP 发明人 FARTASH ARJANG
分类号 H01L23/52;H01L21/3205;H01L21/768;H01L23/48;(IPC1-7):H01L21/320 主分类号 H01L23/52
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