发明名称 APPARATUS AND METHOD FOR PLASMA TREATMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma treatment apparatus for improving the quality of a thin film such as a TiN film formed by plasma treatment, and to provide a plasma treatment method. <P>SOLUTION: The plasma treatment apparatus 10 comprises an electroconductive susceptor 56 for supporting a semiconductor wafer, which is arranged in a treatment chamber 12; an electroconductive gas-distribution plate 24 for distributing and supplying a clean gas for generating plasma, which is arranged so as to face the top face of the susceptor 56; an observation hole 66 made in a chamber wall 16 of the treatment chamber, so as to observe the plasma generated between the susceptor and the gas distribution plate from the outside; and a circular shield 68 made from quartz, which is arranged on the internal surface of the chamber wall so as to cover the observation hole. Because the shield has no unevenness, it makes a treatment gas smoothly flow, prevents plasma convergence due to the turbulent flow of the treatment gas, and makes the plasma treatment uniformly performed on the whole of the film. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004149881(A) 申请公布日期 2004.05.27
申请号 JP20020318204 申请日期 2002.10.31
申请人 APPLIED MATERIALS INC 发明人 TANIMOTO TAKETO;OTA KOJI
分类号 H05H1/46;B01J3/00;B01J19/08;C23C16/34;C23C16/44 主分类号 H05H1/46
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