| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an EL panel and a pixel current testing method that realize a contactless test of a pixel current that a current driving transistor of a pixel circuit constituting the EL panel outputs without requiring any special inspecting device. <P>SOLUTION: A column control line (14) supplying a current signal for setting a gate electrode voltage of a current driving transistor from a column control circuit (1) to a plurality of pixel circuits (2) which include a current driving transistor capable of supplying an injected current to the EL element and are arranged in matrix is connected even to a test current output circuit (23), and after the gate voltage of the current driving transistor is set with a current signal from the column control circuit 1, the output of the current driving transistor is sent from the column control line to a current output line (25) through the test current output circuit to realize the test of the pixel current in a non-contact state without requiring any special inspecting device. <P>COPYRIGHT: (C)2004,JPO |
