发明名称 |
Modular test controller with BISTcircuit for testing embedded DRAM circuits |
摘要 |
A modular test controller with a built-in self-test (BIST) circuit for testing an embedded DRAM (eDRAM) circuit is provided. The test controller includes a built-in self-test (BIST) core for performing tests, the BIST core including proven testing algorithms; a selectable tester interface for interfacing the BIST core with an external tester; and a selectable eDRAM interface for interfacing the BIST core with an eDRAM, the eDRAM including a plurality of memory cells for storing data. The present invention allows semiconductor device designers to keep to one testflow and reuse a proven BIST core over multiple ASIC (Application Specific Integrated Circuits) products/generations.
|
申请公布号 |
US2004103356(A1) |
申请公布日期 |
2004.05.27 |
申请号 |
US20020304506 |
申请日期 |
2002.11.26 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
BOEHLER THOMAS |
分类号 |
G11C29/14;G11C29/40;(IPC1-7):G11C29/00;G01R31/28 |
主分类号 |
G11C29/14 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|