| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To perform the test of a secret data storage part with high secrecy and high reliability while suppressing increase of a chip area. <P>SOLUTION: A semiconductor integrated circuit device is provided with a secret data storage part 302 which stores secret data, a CRC calculating part 303 which converts the data read from the secret data storage part 102 into a restoration impossible data format, and a comparator part 304 which outputs the result of comparison of the data outputted from the CRC calculating part 303 with the data for comparison (the result of the CRC conversion) inputted from the outside to the outside. Moreover, the CRC calculating part 303 can switch the initial value of CRC calculation by the CRC calculation initial value switching control signal to be inputted to an input terminal 308. <P>COPYRIGHT: (C)2004,JPO</p> |
