发明名称 INTEGRATED INRUSH CURRENT LIMITER CIRCUIT AND METHOD
摘要 <p>An inrush current limiter circuit (20) includes a mirrored transistor (50) responsive to a control signal (VDRIVE) developed from a sense current (ISENSE), and has a first source (51) coupled to a supply voltage, a common drain (53) that routes a load current (ILOAD) to an output node (45), and a second source that samples the load current to produce the sense current. A fault protection circuit (64) disables the mirrored transistor in response to a first fault condition (TEMP, UVLO) and is coupled to a first lead (43) for externally adjusting a fault threshold. A fault communication circuit (250) is coupled to the first lead to receive a fault signal representative of an external fault condition to disable the mirrored transistor.</p>
申请公布号 WO2004045038(A1) 申请公布日期 2004.05.27
申请号 WO2003US30918 申请日期 2003.10.01
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES L.L.C. 发明人 BALL, ALAN R.
分类号 H02H3/00;H02H9/00;(IPC1-7):H02H9/00 主分类号 H02H3/00
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