发明名称 |
Semiconductor device and method for fabricating the same |
摘要 |
An inventive semiconductor device includes: an interlevel dielectric film 204 provided on a semiconductor substrate 101; and interconnects 208a and 208c buried in the interlevel dielectric film 204 and electrically connected to the semiconductor substrate 101. An MIM capacitor 201 includes: first and second electrodes 208b and 214b each made of a metal; and a capacitive insulating film 210 of a dielectric. The first electrode 208b is buried in the interlevel dielectric film 204. The capacitive insulating film 210 is provided on the first electrode 208b. The second electrode 214b is a metal layer provided to face the first electrode 208b with the capacitive insulating film 210 interposed therebetween.
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申请公布号 |
US2004099897(A1) |
申请公布日期 |
2004.05.27 |
申请号 |
US20030674068 |
申请日期 |
2003.09.30 |
申请人 |
TSUTSUE MAKOTO;YABU TOSHIKI;KATO YOSHIAKI;UEDA TETSUYA;SEO SATOSHI |
发明人 |
TSUTSUE MAKOTO;YABU TOSHIKI;KATO YOSHIAKI;UEDA TETSUYA;SEO SATOSHI |
分类号 |
H01G4/33;H01L21/02;H01L21/768;H01L21/822;H01L23/522;H01L27/04;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01G4/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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