发明名称 Sensing method and apparatus for resistance memory device
摘要 An MRAM memory integrated circuit is disclosed. Resistance, and hence logic state, is determined by discharging a first charged capacitor through an unknown cell resistive element to be sensed at a fixed voltage, and a pair of reference capacitors. The rate at which the parallel combination of capacitors discharge is between the discharge rate associated with a binary '1' and '0' value, and thus offers a reference for comparison.
申请公布号 US6741490(B2) 申请公布日期 2004.05.25
申请号 US20030422849 申请日期 2003.04.25
申请人 MICRON TECHNOLOGY, INC. 发明人 BAKER R. JACOB
分类号 G11C7/06;G11C11/14;(IPC1-7):G11C11/00 主分类号 G11C7/06
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