| 摘要 |
The present invention provides an improved boundary scan test system that can scan device scan paths in a parallel manner. In one embodiment, an improved method for processing a scan command from a pattern file is provided. The scan command is associated with (e.g., includes, points to) test device data that is to be scanned into physical system under test devices of a type specified by the command. Initially, a parallel device structure is acquired for the specified device type. The parallel device structure has one or more groups each identifying one or more parallel scan paths of devices within the physical system under test. A scan image is then prepared for each of the one or more groups whose one or more identified parallel scan paths include a device of the specified device type. For each group whose one or more scan paths has a device of the specified device type, a scan request, with the scan image prepared for the group, is then generated for that group. The scan request, when provided to a utility unit, causes the unit to scan in parallel the scan image into the one or more scan paths of the group in order to scan the test device data into the devices of the specified device type within the group.
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