发明名称 |
HIGHLY INTEGRATED FERROELECTRIC FLOATING GATE RAM CAPABLE OF BEING OPERATED WITH ONE TRANSISTOR AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A highly integrated FFRAM(Ferroelectric Floating gate Random Access Memory) and a manufacturing method thereof are provided to operate easily the FFRAM by using one transistor and to prevent a semiconductor substrate from reacting on the ferroelectric layer by using a barrier layer. CONSTITUTION: A first conductive pattern(30) is prolonged to a first direction on a semiconductor substrate(10). A second conductive pattern(60) is prolonged to a second direction on the first conductive pattern via a ferroelectric layer(40). The second direction is vertical to the first direction. An active matrix(50) with a source region(54) and a drain region(56) is interposed between the ferroelectric layer and the second conductive layer. A barrier layer(20) is interposed between the substrate and the ferroelectric layer.
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申请公布号 |
KR100434479(B1) |
申请公布日期 |
2004.05.25 |
申请号 |
KR19970031979 |
申请日期 |
1997.07.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG HO |
分类号 |
H01L27/105;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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