发明名称 HIGHLY INTEGRATED FERROELECTRIC FLOATING GATE RAM CAPABLE OF BEING OPERATED WITH ONE TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A highly integrated FFRAM(Ferroelectric Floating gate Random Access Memory) and a manufacturing method thereof are provided to operate easily the FFRAM by using one transistor and to prevent a semiconductor substrate from reacting on the ferroelectric layer by using a barrier layer. CONSTITUTION: A first conductive pattern(30) is prolonged to a first direction on a semiconductor substrate(10). A second conductive pattern(60) is prolonged to a second direction on the first conductive pattern via a ferroelectric layer(40). The second direction is vertical to the first direction. An active matrix(50) with a source region(54) and a drain region(56) is interposed between the ferroelectric layer and the second conductive layer. A barrier layer(20) is interposed between the substrate and the ferroelectric layer.
申请公布号 KR100434479(B1) 申请公布日期 2004.05.25
申请号 KR19970031979 申请日期 1997.07.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG HO
分类号 H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/105
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