| 摘要 |
The invention provides an electronic apparatus test circuit that can reduce the testing time and cost without relying on a PLL circuit. An electronic apparatus test circuit in accordance with the present invention is equipped with a PLL circuit, an external clock circuit that outputs either a multiplied clock signal or an external clock signal according to the state of a test signal, a divider circuit that divides the multiplied clock signal or an external clock signal to generate and output a system clock signal for a logic circuit and a clock signal for an encoder circuit, an input cell, a reception circuit, a decoder circuit, a logic circuit that processes with a specified logic circuit decoded data according to a system clock signal for the logic circuit, an encoder circuit that encodes the processed data according to a clock signal for the encoder circuit, a transmission circuit that transmits the encoded data, and an output cell.
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