发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to be capable of forming a small size floating gate on the first polysilicon layer without a mask process. CONSTITUTION: A tunnel oxide layer(12), the first polysilicon layer(14), and a pad nitride layer are sequentially formed on a semiconductor substrate(10). A trench is formed in the semiconductor substrate by selectively etching the resultant structure. An oxide layer is deposited on the entire surface of the resultant structure. A planarization is carried out on the oxide layer for exposing the pad nitride layer. The protrusion of an oxide layer is formed by etching the pad nitride layer. The second polysilicon layer(24) is deposited on the entire surface of the resultant structure. The second polysilicon layer is polished for exposing the protrusion. A floating gate(26) is formed by partially etching the protrusion. A dielectric layer(28) and a control gate are sequentially formed on the resultant structure.
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申请公布号 |
KR20040043284(A) |
申请公布日期 |
2004.05.24 |
申请号 |
KR20020071503 |
申请日期 |
2002.11.18 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, JEONG RYEOL;KIM, JEOM SU |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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