发明名称 SURFACE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a surface inspection device which acquires highly accurately surface shape information. SOLUTION: This surface inspection device for picking up an interference fringe image formed by an optical element for interference fringe formation and a measuring object, and for inspecting the surface shape of the measuring object based on the interference fringe image, is equipped with a moving means for moving the measuring object in the approximately vertical direction, in the state where a measuring surface of the measuring object is erected in the approximately vertical direction. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004144648(A) 申请公布日期 2004.05.20
申请号 JP20020310962 申请日期 2002.10.25
申请人 NIDEK CO LTD 发明人 OSAWA KOJI;TAKAHASHI TATSUFUMI;NATSUME KATSUHIRO;MIURA YUKIHIRO
分类号 G01B11/30;G01B11/06;G01N21/958;G03F1/00;H01L21/68;(IPC1-7):G01B11/30 主分类号 G01B11/30
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