发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for fabricating a semiconductor device in which generation of grooving or void can be suppressed on the surface of interconnect lines. SOLUTION: A first film of an insulating material is formed on a substrate. A recess is made in the first film. A conductive film of metal is deposited on the first film to bury the recess. The conductive film is polished to leave a part thereof in the recess. Processing liquid containing an organic compound is touched to the surface of the conductive film left in the recess and a coating film is formed on the surface of the conductive film. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004146600(A) 申请公布日期 2004.05.20
申请号 JP20020309958 申请日期 2002.10.24
申请人 FUJITSU LTD 发明人 SHIRASU TETSUYA
分类号 H01L21/3205;H01L21/304;H01L21/306;H01L23/52;(IPC1-7):H01L21/304;H01L21/320 主分类号 H01L21/3205
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