发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for fabricating a semiconductor device in which generation of grooving or void can be suppressed on the surface of interconnect lines. SOLUTION: A first film of an insulating material is formed on a substrate. A recess is made in the first film. A conductive film of metal is deposited on the first film to bury the recess. The conductive film is polished to leave a part thereof in the recess. Processing liquid containing an organic compound is touched to the surface of the conductive film left in the recess and a coating film is formed on the surface of the conductive film. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004146600(A) |
申请公布日期 |
2004.05.20 |
申请号 |
JP20020309958 |
申请日期 |
2002.10.24 |
申请人 |
FUJITSU LTD |
发明人 |
SHIRASU TETSUYA |
分类号 |
H01L21/3205;H01L21/304;H01L21/306;H01L23/52;(IPC1-7):H01L21/304;H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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