发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device which can acquire resistivity to ESD even if an input bump is allocated in the place far from an input/output circuit near to the external circumference of a semiconductor chip. <P>SOLUTION: The semiconductor device comprises the input/output circuit 13 formed in the place near to the external circumference of the semiconductor chip 11, a function module 14 formed in the center side of the input/output circuit 13 of the semiconductor chip 11, an electrostatic discharge protection circuit 15 which is formed within the function module 14 of the semiconductor chip 11 to protect the circuit in the subsequent stage from breakdown due to the electrostatic discharge, and a bump 12A which is allocated on one main surface of the semiconductor chip 11 near the function module 14 and is connected to the function module 14 via the electrostatic discharge protection circuit 15. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004146524(A) 申请公布日期 2004.05.20
申请号 JP20020308668 申请日期 2002.10.23
申请人 TOSHIBA CORP 发明人 TAKAHASHI MAKOTO
分类号 H01L27/04;H01L21/822;H01L23/498;H01L23/60;H01L23/62;H01L23/64;H05K1/02;H05K1/18;H05K3/46 主分类号 H01L27/04
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