发明名称 |
Variable capacitance device and process for manufacturing the same |
摘要 |
A variable capacitance device comprising, in a semiconductor layer formed on a substrate via an buried oxide film: an n- region 132 formed in the shape of a ring and containing an n-type dopant; an anode 133 adjoined to the outer periphery of the n- region 132, the anode 133 being formed in the shape of a ring and containing a p-type dopant; and a cathode 131 adjoined to the inner periphery of the n- region 132, the third region containing an n-type dopant, wherein the dopant concentration in the n- region 132 is lower than that in each of the anode 133 and the cathode 131.
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申请公布号 |
US2004094792(A1) |
申请公布日期 |
2004.05.20 |
申请号 |
US20030456531 |
申请日期 |
2003.06.09 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
AKIRA ASAI;TERUHITO OHNISHI |
分类号 |
H01L21/329;H01L21/84;H01L27/12;H01L29/93;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/329 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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