发明名称 APPARATUS FOR LASER IRRADIATION AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING SAME
摘要 PROBLEM TO BE SOLVED: To provide a solution to the problem that the transmittance of an fθlens used as a laser condensing means is different at its center and edge, thus causing a difference in energy of a laser beam irradiating a semiconductor film when used for laser crystallization on an as-is basis, and making it impossible to uniformly irradiate the entire semiconductor film. SOLUTION: An apparatus for laser irradiation using a galvanomirror, and an fθlens optical system can offset an energy change caused by a change in fθlens's transmittance, and can do laser scanning while controlling changes of energy given to an irradiated object. Further, a semiconductor device manufacturing method using the apparatus is provided. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004146823(A) 申请公布日期 2004.05.20
申请号 JP20030345276 申请日期 2003.10.03
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TANAKA KOICHIRO
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;H01S3/00;(IPC1-7):H01L21/268 主分类号 H01L21/20
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