摘要 |
PROBLEM TO BE SOLVED: To provide a connector for a memory card capable of simplifying a manufacturing process by forming an insertion hole of a probe used for a connector continuity test larger than a pressing scar of a fixing pin, and of increasing the degree of freedom of the size of the connector. SOLUTION: In this connector, the pressing scar 20 of the metal contact fixing pin formed in a housing 12 of the connector 10 is formed as the probe insertion hole larger than at least the outside shape of the probe for the connector continuity test. COPYRIGHT: (C)2004,JPO
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