| 摘要 |
PROBLEM TO BE SOLVED: To enable highly accurate calibration without using highly accurate A/D converter for the calibration. SOLUTION: The present invention provides an improved IC tester for testing a testing object. The tester has an output D/A converter for outputting a test signal imparted to the testing object, at least one calibration D/A converter for calibrating the test signal from the output D/A converter, a selection part for selecting an output from the output D/A converter and an output from the calibration D/A converter, and a calibration A/D converter for inputting an output of the selection part. The output D/A converter and the calibration D/A converter are calibrated by the calibration A/D converter, in the tester. COPYRIGHT: (C)2004,JPO
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