发明名称 Integrated circuit structure
摘要 An interlayer dielectric multilayer film is formed by providing a boron nitride film as a protective film 34 between interlayer dielectric films 33 with a low relative dielectric constant which comprise organic coated films or porous films. The interlayer dielectric films 34 having a low relative dielectric constant are combined with the boron nitride film excellent in mechanical and chemical resistance, high in thermal conductivity and having a low relative dielectric constant, thereby achieving a low relative dielectric constant, while maintaining adhesion and moisture absorption resistance.
申请公布号 US2004094840(A1) 申请公布日期 2004.05.20
申请号 US20030472462 申请日期 2003.09.22
申请人 SAKAMOTO HITOSHI;UEDA NORIAKI;SUGINO TAKASHI 发明人 SAKAMOTO HITOSHI;UEDA NORIAKI;SUGINO TAKASHI
分类号 C23C16/38;H01L21/31;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 C23C16/38
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