发明名称 |
Boundary scan with strobed pad driver enable |
摘要 |
A circuit and a method are provided for testing the enable function of Boundary Scan Register bits that control the driver of unconnected I/O pins of an 1149.1-compliant IC during the IC's reduced pin-count access manufacturing test, and to test the connections to these pins during the test of a circuit board containing the IC, without causing excessive current if a pin is inadvertently short circuited.
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申请公布号 |
US2004098648(A1) |
申请公布日期 |
2004.05.20 |
申请号 |
US20030701479 |
申请日期 |
2003.11.06 |
申请人 |
SUNTER STEPHEN K.;GAUTHIER PIERRE;NADEAU-DOSTIE BENOIT |
发明人 |
SUNTER STEPHEN K.;GAUTHIER PIERRE;NADEAU-DOSTIE BENOIT |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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