发明名称 Process for fabricating ultra-low contact resistances in GaN-based devices
摘要 A process for fabricating ohmic contacts in a field-effect transistor includes the steps of: thinning a semiconductor layer forming recessed portions in the semiconductor layer; depositing ohmic contact over the recessed portions; and heating the deposited ohmic contacts. The field-effect transistor comprises a layered semiconductor structure which includes a first group III nitride compound semiconductor layer doped with a charge carrier, and a second group III nitride compound semiconductor layer positioned below the first layer, to generate an electron gas in the structure. After the heating step the ohmic contacts communicate with the electron gas. As a result, an excellent ohmic contact to the channel of the transistor is obtained.
申请公布号 US2004094759(A1) 申请公布日期 2004.05.20
申请号 US20030600521 申请日期 2003.06.19
申请人 HRL LABORATORIES, LLC 发明人 NGUYEN NGUYEN XUAN;HASHIMOTO PAUL;NGUYEN CHANH N.
分类号 H01L21/285;H01L21/337;H01L29/20;H01L29/45;(IPC1-7):H01L47/00 主分类号 H01L21/285
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