发明名称 Method for polishing semiconductor wafer and polishing pad for the same
摘要 On the surface of a belt-type surface plate wound around two rollers whose rotation axes are arranged in parallel with each other, four or other number of sheet-shaped polishing pads of polyurethane are stuck. Each of the polishing pads has grooves extending in the same direction as the drive direction of the surface plate. Moreover, the polishing pads adjacently arranged in the drive direction of the surface plate are stuck apart in such a manner that the grooves of one polishing pad are spaced not to align with the respective grooves of the other polishing pad.
申请公布号 US2004097174(A1) 申请公布日期 2004.05.20
申请号 US20030665015 申请日期 2003.09.22
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 SHIRAKASHI EIGO;HAMANAKA MASASHI;ITO FUMITAKA
分类号 B24B21/00;B24B21/04;B24B37/00;B24B37/04;B24B37/20;B24B37/24;B24B37/26;H01L21/304;(IPC1-7):B24B1/00 主分类号 B24B21/00
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