发明名称 Testing resistance bolometer arrays
摘要 A method of testing resistance bolometer arrays involves applying different voltages to different bolometers so as to produce a detectable difference between adjacent bolometers under normal conditions. The voltages may be applied in a recognisable pattern so that faults can be readily identified from a visual display of the array. <IMAGE>
申请公布号 EP1241457(A3) 申请公布日期 2004.05.19
申请号 EP20020251807 申请日期 2002.03.13
申请人 INFRARED INTEGRATED SYSTEMS LTD. 发明人 PORTER, STEPHEN GEORGE;FOX, JOHN;SINGH, BHAJAN
分类号 G01J5/24;G01J5/52 主分类号 G01J5/24
代理机构 代理人
主权项
地址