| 发明名称 |
Method and apparatus for fault tolerant and flexible test signature generator |
| 摘要 |
An apparatus with a generator to generate a pattern and multiple scan chains configured to receive the pattern from the generator. Multiple signature registers coupled to the scan chains, to receive an output of at least one of scan chains during a mode of the integrated device.
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| 申请公布号 |
US6738939(B2) |
申请公布日期 |
2004.05.18 |
| 申请号 |
US20010862407 |
申请日期 |
2001.05.21 |
| 申请人 |
INTEL CORPORATION |
发明人 |
UDAWATTA KAPILA B.;BABELLA ANTHONY |
| 分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
| 代理机构 |
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代理人 |
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| 地址 |
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