发明名称 Chip scale package and manufacturing method
摘要 A chip scale package mainly comprises a substrate attached to the active surface of a semiconductor chip through an anisotropic conductive adhesive film (ACF). The substrate is provided with a plurality of contact pads on the lower surface thereof and a plurality of solder pads on the upper surface thereof wherein the contact pads are electrically coupled to corresponding solder pads. A plurality of metal bumps provided on the contact pads of the substrate. The metal bumps on the substrate are electrically coupled to corresponding bonding pads on the chip through the ACF. The side portions of the substrate and the ACF are sealed in a package body. The present invention further provides a method of making the chip scale package at the wafer level. The method is characterized by attaching substrates onto the chips of a wafer one by one so as to greatly reduce the problems associated with CTE mismatch between the wafer and the substrate thereby significantly enhancing the product yield.
申请公布号 US6737300(B2) 申请公布日期 2004.05.18
申请号 US20020151042 申请日期 2002.05.21
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 DING YI-CHUAN;LEE XIN HUI;CHEN KUN-CHING
分类号 H01L21/56;H01L21/60;H01L21/68;(IPC1-7):H01L21/48;H05K3/34 主分类号 H01L21/56
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