发明名称 Multilevel interconnect structure containing air gaps and method for making
摘要 A method for forming a multilayer interconnect structure on a substrate that include interconnected conductive wiring and vias spaced apart by a combination of solid or gaseous dielectrics. The inventive method includes the steps of: (a) forming a first planar via plus line level pair embedded in a dielectric matrix formed from one or more solid dielectrics and comprising a via level dielectric and a line level dielectric on a substrate, wherein, at least one of said solid dielectrics is at least partially sacrificial; (b) etching back sacrificial portions of said at least partially sacrificial dielectrics are removed to leave cavities extending into and through said via level, while leaving, at least some of the original via level dielectric as a permanent dielectric under said lines; (c) partially filling or overfilling said cavities with a place-holder material which may or may not be sacrificial; (d) planarizing the structure by removing overfill of said place-holder material; (e) repeating, as necessary, steps (a)-(d); (f) forming a dielectric bridge layer over the planar structure; and (g) forming air gaps by at least partially extracting said place-holder material.
申请公布号 US6737725(B2) 申请公布日期 2004.05.18
申请号 US20020144574 申请日期 2002.05.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GRILL ALFRED;HEDRICK JEFFREY CURTIS;JAHNES CHRISTOPHER VINCENT;NITTA SATYANARAYANA VENKATA;PETRARCA KEVIN S.;PURUSHOTHAMAN SAMPATH;SAENGER KATHERINE LYNN;WHITEHAIR STANLEY JOSEPH
分类号 H01L21/768;(IPC1-7):H01L29/00 主分类号 H01L21/768
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