发明名称 |
Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals |
摘要 |
An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
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申请公布号 |
US6737881(B2) |
申请公布日期 |
2004.05.18 |
申请号 |
US20020054139 |
申请日期 |
2002.01.22 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
SAKAYORI HIROSHI;KOMURO TAKANORI |
分类号 |
G01R31/316;G01R31/28;G01R31/3167;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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