| 摘要 |
An on-chip watchdog circuit (100) is provided that generates an output signal (175) when an error signal (112) generated by a circuit under test (110) is detected. The on-chip watchdog circuit (100) comprises a logic gate (125) that is connected to a clock signal and receives a signal in response to the error signal 112 generated by the circuit under test (110). A gate output circuit (140) is connected to an output of the logic gate (125). An RC circuit (150) is connected to the gate output circuit (140). A comparator (170) is connected to the RC circuit (150). The comparator (170) is also connected to a voltage divider (160) and provides the output signal (175) in response to the error signal (112) generated by the circuit under test (110), and the on-chip watchdog circuit (100) and the circuit under test (110) are integrated on a same semiconductor microchip.
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