发明名称 |
System for inspecting EUV lithography masks |
摘要 |
A system for inspecting lithography masks utilizing a laser source to produce a coherent electromagnetic radiation pulse. The pulse is passed to a target which creates a plasma resulting in an extreme ultraviolet (EUV) beam. The beam is condensed and passed through an aperture to define a cross-sectional area of the condensed EUV beam on a lithography mask. A transmission zone plate resolves the image reflected from the lithography mask and passes the image to a detector for analysis.
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申请公布号 |
US6738135(B1) |
申请公布日期 |
2004.05.18 |
申请号 |
US20020153135 |
申请日期 |
2002.05.20 |
申请人 |
UNDERWOOD JAMES H.;PERERA RUPERT C. C.;NAULLEAU PATRICK |
发明人 |
UNDERWOOD JAMES H.;PERERA RUPERT C. C.;NAULLEAU PATRICK |
分类号 |
G01N21/956;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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