发明名称 Method of fabricating a trench structure substantially filled with high-conductivity material
摘要 A trench structure that is substantially filled with high-conductivity material such as refractory metal particularly suitable for fast switching trench MOSFET applications. The trench is first lined by a dielectric material such as silicon dioxide. A layer of polysilicon is then formed on the dielectric material and provides buffering for stress relief. The trench is then filled substantially with refractory metal such as tungsten.
申请公布号 US6737323(B2) 申请公布日期 2004.05.18
申请号 US20010879029 申请日期 2001.06.11
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 MO BRIAN S.
分类号 H01L21/28;H01L21/285;H01L21/336;H01L29/423;H01L29/43;H01L29/49;H01L29/51;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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