发明名称 Optical subassembly tester and testing method
摘要 An apparatus and method are provided for testing an optical subassembly of an optoelectronic device before attaching the electrical component. The method includes assembling a test circuit on a printed circuit board ("PCB") and placing the PCB in the base portion of a clamping device. The optical subassembly is assembled and electrically connected to a flexible circuit. The clamping device is closed to form a temporary electrical connection between the flexible circuit and the test circuit. The flexible circuit is, in turn, connected to the optical subassembly. A data stream is transmitted through the optical subassembly and evaluated for compliance.
申请公布号 US2004091231(A1) 申请公布日期 2004.05.13
申请号 US20030695203 申请日期 2003.10.28
申请人 HOFMEISTER RUDOLF J.;KUMAR DEV E.;BENCH SAMANTHA R. 发明人 HOFMEISTER RUDOLF J.;KUMAR DEV E.;BENCH SAMANTHA R.
分类号 G02B6/00;H04B10/08;(IPC1-7):G02B6/00 主分类号 G02B6/00
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