发明名称 ETCHING APPARATUS AND METHOD USING ION BEAM SPUTTERING
摘要 PURPOSE: An etching apparatus and its method using ion beam sputtering are provided to be capable of effectively carrying out an etching process. CONSTITUTION: An ion beam sputtering etching apparatus is provided with a vacuum chamber(100) and a target loading head(118) installed at the upper portion in the vacuum chamber. At this time, the target loading head includes a sample support part(112) for supporting a sample(114). The ion beam sputtering etching apparatus further includes a chuck(120) installed at the lower portion in the vacuum chamber opposite to the sample support part of the target loading head, a power supply part(130) for supplying power to the target loading head and the chuck, a gas supply part(140) for supplying inert gas into the vacuum chamber, and an ion beam supply part(150) for supplying ion beam into the vacuum chamber.
申请公布号 KR20040040962(A) 申请公布日期 2004.05.13
申请号 KR20020069348 申请日期 2002.11.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, EUN GYEONG;LIM, TAEK JIN
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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