发明名称 |
ETCHING APPARATUS AND METHOD USING ION BEAM SPUTTERING |
摘要 |
PURPOSE: An etching apparatus and its method using ion beam sputtering are provided to be capable of effectively carrying out an etching process. CONSTITUTION: An ion beam sputtering etching apparatus is provided with a vacuum chamber(100) and a target loading head(118) installed at the upper portion in the vacuum chamber. At this time, the target loading head includes a sample support part(112) for supporting a sample(114). The ion beam sputtering etching apparatus further includes a chuck(120) installed at the lower portion in the vacuum chamber opposite to the sample support part of the target loading head, a power supply part(130) for supplying power to the target loading head and the chuck, a gas supply part(140) for supplying inert gas into the vacuum chamber, and an ion beam supply part(150) for supplying ion beam into the vacuum chamber.
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申请公布号 |
KR20040040962(A) |
申请公布日期 |
2004.05.13 |
申请号 |
KR20020069348 |
申请日期 |
2002.11.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, EUN GYEONG;LIM, TAEK JIN |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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地址 |
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