发明名称 Method for using additives in the caustic etching of silicon for obtaining improved surface characteristics
摘要 A method for the caustic etching of silicon which is of importance for the semiconductor industry and silicon wafer manufacture in particular, that includes using one or more iodate or chlorite salts as additives in the etching process to achieve improved surface conditions, such as smaller facets and lower roughness, on the resulting silicon substrate.
申请公布号 US2004089419(A1) 申请公布日期 2004.05.13
申请号 US20030692661 申请日期 2003.10.24
申请人 PAW WILTOLD;WOLK JONATHAN 发明人 PAW WILTOLD;WOLK JONATHAN
分类号 C23F1/00;H01L21/306;(IPC1-7):C23F1/00 主分类号 C23F1/00
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