发明名称 METHOD AND STRUCTURE FOR MOUNTING SEMICONDUCTOR DEVICE, ELECTROOPTIC DEVICE, METHOD OF MANUFACTURING ELECTROOPTIC DEVICE, AND ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a novel method of mounting semiconductor device by which the reliability of conductive joints can be improved even when the numbers of wiring terminals and electrodes increase and the intervals among them become narrower, and to provide a structure for mounting the semiconductor device, an electrooptic device, and electronic equipment. <P>SOLUTION: Wiring terminals are formed on a wiring board and electrodes are formed in a semiconductor device. The wiring terminals are formed so that their widths may become narrower than those of the electrodes. When the semiconductor device is mounted on the wiring board, the wiring terminals bite into the electrodes due to applied pressurizing forces. It is preferable to adjust the biting amounts of the wiring terminals into the electrodes within the range of from about 1 &mu;m to 5 &mu;m. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004140331(A) 申请公布日期 2004.05.13
申请号 JP20030197276 申请日期 2003.07.15
申请人 SEIKO EPSON CORP 发明人 YAMADA KAZUYUKI;ASHIDA TAKESHI;NAKAZAWA MASAHIKO;YUMOTO MASANORI
分类号 G02F1/1345;G02F1/13;G02F1/1362;G09F9/00;H01L21/60;H01L21/603;H01L23/00;H01L23/485;H01L23/498;H05K3/32 主分类号 G02F1/1345
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